ELA
Senior Member
- Occupation
- Electrical Test Engineer
100405-2026 EST
ELA:
Do you have access to any test equipment to perform more controlled experiments than random switching of an inductive load?
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Gar,
In a previous job I used to have access to many kinds of EMC test equipment as I was tasked with precompliance testing for CE marking of the equipment we built.
Manufacturers of GFCI's for the average market often talk about their ability to pass a Ring-Wave test. This is a high voltage spike with a limited rise time. Many pieces of equipment can pass this test with only an MOV at the input.
For CE marking we also had to withstand an EFT (Electric Fast Transient) test. This test applies high voltage spikes with a fast rise time and also has a "burst requirement". In the burst mode the device under test must withstand a burst of many pulses one right after the other.
This is an excellent test to shake out weaknesses in an EMC design.
If equipment fails this test an MOV alone is not enough. It must be followed by a filter as well.
The advantage of having an EFT generator is adjustability of the test level, repeatability as well as ability to apply the burst.
It is one of my favorite pieces of test equipment and I miss it dearly.
Unfortunately I no longer have access to any of that EMC test equipment.
Every time we talk about suspected EMI issues I long to have access to that equipment once again.
If one were interested you can build an inexpensive transient generator by cross coupling a number of relays in a configuration known as the NEMA Chattering Relay test. This was NEMAs early attempt - prior to introduction of EFT generators.
This can be pretty effective but it may take some time to select the best relays and to characterize the output.
I know you like to use your Fluorescent fixture to generate transients. Have you considered trying oscillating relays to ramdonly open and close the ballast circuit?
I am sure it would be hard on the bulb but might produce the desired output?